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Paper   IPM / Nano-Sciences / 8917
School of Nano Science
  Title:   Stochastic features of rough surfaces: analysis of laser-induced silicon surface modification
1.  M. Vahabi
2.  Gholam Reza Jafari
3.  N. Mansour
4.  R. Karimzadeh
5.  J. Zamiranvari
  Status:   Published
  Journal: J.Stat. Mech: Theory and Experiments
  No.:  March 2008
  Vol.:  2008
  Year:  2009
  Pages:   1742-5468
  Publisher(s):   OP Publishing Ltd and SISSA
  Supported by:  IPM
We have used level crossing analysis to obtain further insights on roughness and multifractality. In addition, sources of multifractality could be specified by using shuffling and surrogate procedures. We have shown how these concepts could explain a rough surface for the purpose of suitable application and how experimental parameters can affect its properties. To make it more clear, we have used laser-induced etching of silicon in some interfaces such as water, ethanol and air, as an example. The effect of liquid interfaces on generating topographic rough surfaces in silicon has been studied using the atomic force microscopy technique (AFM).

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