“School of Nano-Sciences”
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| Paper IPM / Nano-Sciences / 8917 |
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We have used level crossing analysis to obtain further insights on roughness and multifractality. In addition, sources of multifractality could be specified by using shuffling and surrogate procedures. We have shown how these concepts could explain a rough surface for the purpose of suitable application and how experimental parameters can affect its properties. To make it more clear, we have used laser-induced etching of silicon in some interfaces such as water, ethanol and air, as an example. The effect of liquid interfaces on generating topographic rough surfaces in silicon has been studied using the atomic force microscopy technique (AFM).
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