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Paper   IPM / Nano-Sciences / 8343
School of Nano Science
  Title:   Etched Glass Surfaces, Atomic Force Microscopy and Stochastic Analysis
1.  Gholam Reza Jafari
2.  A. Iraji zad
3.  Mohammad Reza Rahimi tabar
4.  G. Kavei
  Status:   Published
  Journal: Physica A
  No.:  1
  Vol.:  375
  Year:  2007
  Pages:   7
  Publisher(s):   Elsevier B.V.
  Supported by:  IPM
The effect of etching time scale of glass surface on its statistical properties has been studied using atomic force microscopy technique. We have characterized the complexity of the height fluctuation of a etched surface by the stochastic parameters such as intermittency exponents, roughness, roughness exponents, drift and diffusion coefficients and find their variations in terms of the etching time.

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